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Extra resources for Advanced scanning microscopy for nanotechnology techniques and applications
The cross shows the computed location of the pattern center. Graphic inset shows approximate orientation of the crystal with respect to the sample surface. In 1984, Dingley continued Venables earlier work with a phosphor screen and TV camera but added computer-aided indexing. This was a major step forward and became the model for modern-day EBSD systems. In 1986, Niels Schmidt (Denmark) wrote software to index electron-channeling patterns (ECP) for all seven-crystal systems when he was a student at Aarhus University, before he went to Risoe National Laboratories.
20. -R. Peters, Scan. , 4 (1985) 1519. 21. R. P. Apkarian, 45th Annual Proceedings of the Microscopy Society of America (1987) 564. 22. D. C. Joy, 52nd Annual Proceedings of the Microscopy Society of America (1994). 23. E. L. Bearer, L. Orci, P. Sors, J. , 100 (1985) 418. 24. R. P. Apkarian, Scanning, 19 (1997) 361. 2 Electron Backscatter Diffraction (EBSD) Technique and Materials Characterization Examples Tim Maitland and Scott Sitzman 1. Introduction The term “electron backscatter diffraction” (EBSD) is now synonymous with both the scanning electron microscope (SEM) technique and the accessory system that can be attached to an SEM.
Carbon nanotubes, nanowires, nanoparticles, and nanostructured materials, can be observed by SEM directly through loading them on carbon tape. The sample preparation is quite simple. Some nonconductive nanomaterials, especially bioorganic nanomaterials need metal coating and complicated sample preparation process. In this section, a detailed procedure on bioorganic specimen will be discussed. 1. Procedures for High-Resolution SEM of Bioorganic Specimens The SEM column, gun, and specimen chambers all maintain a vacuum of 10−6 Torr or better for performance of the electron optics.